Siberian Federal University

This paper considers the dependence exchange bias on the thickness of the intermediate layer of cop- per and temperature in polycrystalline thin films ferromagnet / nonmagnetic metal / antiferromagnet (Fe/Cu/CoO). We have revealed oscillatory of exchange bias value in depending on the thickness of the copper layer. The oscillation of the most clearly manifested in a certain range of temperatures. For the first time by us detected the oscillation of the exchange bias with increasing temperature, these oscillations occur with a change of sign of the field exchange interaction.