Journal of Siberian Federal University. Chemistry / Analytical Investigations of Silicon Production Raw Materials and Products

Full text (.pdf)
Issue
Journal of Siberian Federal University. Chemistry. 2017 10 (1)
Authors
Nemchinova, Nina V.; Tyutrin, Andrey A.; Sokolnikova, Yuliya V.; Fereferova, Tatiana T.
Contact information
Nemchinova, Nina V.: Irkutsk National Research Technical University 83 Lermontov Str., Irkutsk, 664074, Russia; Tyutrin, Andrey A.: Irkutsk National Research Technical University 83 Lermontov Str., Irkutsk, 664074, Russia; ; Fereferova, Tatiana T.: “Kremniy” CJSC 1 Yuzhnaya Str., Shelekhov, Irkutsk region, 666034, Russia
Keywords
silicon; quartz raw materials; slags; atomic emission spectrometry; inductively coupled plasma mass spectrometry; metallography; X-ray fluorescence analysis; gravimetry
Abstract

The paper presents the results of analytic investigations of raw materials, silicon and slags of carbothermic process executed by various methods. The analytical techniques: both direct and with sample decomposition have been applied at the Institute of Geochemistry in Irkutsk, Russia to determine the contents of element impurities in quartz raw materials and different types of silicon. These are atomic emission spectrometry (AES), X-ray fluorescence analysis (XRF), AES with concentration and inductively coupled plasma mass spectrometry (ICP-MS). Compared analytical results obtained with different methods agree quite well. At the Department of Metallurgy of Non-Ferrous Metals of Irkutsk State Technical University metallographic investigations carried out using a microscope “Olympus GX-51” in the reflected light. In studying the microstructure of silicon metal the intermetallic inclusions were found which are located along the grain boundaries. Slags analysis showed that they contain silicon, that is the reason for its loss during melting. The article also presents the results of chemical analysis of technical, refined silicon and slag samples, obtained in the laboratory of “Kremniy” CJSC using XRF and chemical gravimetry

Pages
37-48
Paper at repository of SibFU
https://elib.sfu-kras.ru/handle/2311/32426