Journal of Siberian Federal University. Mathematics & Physics / Energy Gap Evaluation in Microcrystalline m-HfO2 Powder

Full text (.pdf)
Issue
Journal of Siberian Federal University. Mathematics & Physics. 2021 14 (2)
Authors
Shilov, Artem O.; Savchenko, Sergey S.; Vokhmintsev, Alexander S.; Chukin, Andrey V.; Karabanalov, Maksim S.; Vlasov, Maksim I.; Weinstein, Ilya A.
Contact information
Shilov, Artem O.: NANOTECH Centre, Ural Federal University Yekaterinburg, Russian Federation; OCRID: 0000-0001-8189-2431; Savchenko, Sergey S.: NANOTECH Centre, Ural Federal University Yekaterinburg, Russian Federation; OCRID: 0000-0002-6256-5483; Vokhmintsev, Alexander S.: NANOTECH Centre, Ural Federal University Yekaterinburg, Russian Federation; OCRID: 0000-0003-2529-3770; Chukin, Andrey V.: NANOTECH Centre, Ural Federal University Yekaterinburg, Russian Federation; OCRID: 0000-0001-7611-9591; Karabanalov, Maksim S.: NANOTECH Centre, Ural Federal University Yekaterinburg, Russian Federation; OCRID: 0000-0001-6619-2816; Vlasov, Maksim I.: NANOTECH Centre, Ural Federal University Yekaterinburg, Russian Federation; Institute of High-Temperature Electrochemistryof of the Ural Branch RAS Yekaterinburg, Russian Federation; Weinstein, Ilya A.: NANOTECH Centre, Ural Federal University Yekaterinburg, Russian Federation; Institute of Metallurgy of the Ural Branch RAS Yekaterinburg, Russian Federation; OCRID: 0000-0002-5573-7128
Keywords
hafnium dioxide; diffuse reflectance; absorption edge
Abstract

In this paper optical properties of microcrystalline HfO2 powder are investigated. X-ray diffraction and Raman spectroscopy were used to determine that the studied samples are in monoclinic phase. Based on the analysis of the diffuse reflectance spectra and applying Kubelka-Munk formalism we evaluated the indirect bandgap value Eg = 5.34 ± 0.05 eV. The calculated value is in agreement with independent data for HfO2 thin films synthesized by various methods. The paper is based on the materials of the report presented at the first Russian scientific confererence with the participation of the international community "YENISEI PHOTONICS – 2020"

Pages
224–229
DOI
10.17516/1997-1397-2021-14-2-226-231
Paper at repository of SibFU
https://elib.sfu-kras.ru/handle/2311/137975