Siberian Federal University 
- Issue
- Journal of Siberian Federal University. Mathematics & Physics. Prepublication
- Authors
- Akashev, Lev A.; Korkh, Yulia V.; Popov, Nikolai A.; Kuznetsova, Tatiana V.; Konyukova, Alla V.; Shevchenko, Vladimir G.
- Contact information
- Akashev, Lev A. : Institute of Solid State Chemistry UB RAS Ekaterinburg, Russian Federation; Korkh, Yulia V. : M. N. Mikheev Institute of Metal Physics of the UB RAS Ekaterinburg, Russian Federation; Popov, Nikolai A. : Institute of Solid State Chemistry UB RAS Ekaterinburg, Russian Federation; OCRID: 0000-0002-4976-1295; Kuznetsova, Tatiana V. : M. N. Mikheev Institute of Metal Physics of the UB RAS Ekaterinburg, Russian Federation; Konyukova, Alla V. : Institute of Solid State Chemistry UB RAS Ekaterinburg, Russian Federation; Shevchenko, Vladimir G. : Institute of Solid State Chemistry UB RAS Ekaterinburg, Russian Federation
- Keywords
- thin film ellipsometry; Cauchy formula; boron oxide reduction
- Abstract
This paper investigates the reduction of boron oxide deposited by vacuum thermal evap- oration on aluminum and samarium surfaces using optical methods of Raman spectroscopy (RS) and spectral ellipsometry. Raman peaks corresponding to vibrations of β-rhombohedral boron (β-B).were de- tected in the spectra of these samples. Spectral ellipsometry was used to determine the optical constants and thickness of the nanoscale boron film in the spectral range from 270 nm to 1000 nm
- Pages
- 60–64
- EDN
- CLBQRT
- Paper at repository of SibFU
- https://elib.sfu-kras.ru/handle/2311/157924
Journal of Siberian Federal University. Mathematics & Physics / Reduction of Boron Oxide on Polycrystalline Al and Sm Substrates
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