Journal of Siberian Federal University. Chemistry: Application of Scanning Electron Microscopy in Material Science

Journal of Siberian Federal University. Chemistry / Application of Scanning Electron Microscopy in Material Science

Issue: Journal of Siberian Federal University. Chemistry. 2009 2 (4)
Authors: Zeer, Galina M.; Fomenko, Oksana Yu.; Ledyaeva, Olga N.
Contact information: Zeer, Galina M. : Siberian Federal University ; 79 Svobodny, Krasnoyarsk, 660041 Russia , e-mail: ; Fomenko, Oksana Yu. : Siberian Federal University ; 79 Svobodny, Krasnoyarsk, 660041 Russia; Ledyaeva, Olga N. : Siberian Federal University ; 79 Svobodny, Krasnoyarsk, 660041 Russia
Keywords: scanning electron microscopy; microstructure; X-ray microanalysis
Abstract: Some aspects of application of scanning electron microscopy and X-ray microanalysis to study materials were considered. Capabilities of JSM 7001F scanning electron microscope of JEOL Company with a set of Oxford Instruments (UK) microanalyzers were demonstrated using diffusive compositions of heterogeneous compounds, silver electrical contacts as well as an aluminum alloy.
Pages: 287-293
Paper at repository of SibFU: https://elib.sfu-kras.ru/handle/2311/1656