- Issue
- Journal of Siberian Federal University. Chemistry. 2009 2 (4)
- Authors
- Zharkov, Sergey M.
- Contact information
- Zharkov, Sergey M. : L.V. Kirensky Institute of Physics SB RAS Siberian Federal University ; 50 Akademgorodok, Krasnoyarsk, 660036 Russia 79 Svobodny, Krasnoyarsk, 660041 Russia , e-mail:
- Keywords
- transmission electron microscopy; electron diffraction; X-ray spectrum analysis
- Abstract
At the example of Al/Au thin films, Pd-Au nanoparticles, carbon nanotubes, and, photonic crystal, the performance capabilities of modern transmission electron microscopy in the studies of microstructure are shown. The application of the methods of high-resolution and analytical transmission electron microscopy, and, electron diffraction is demonstrated.
- Pages
- 294-306
- Paper at repository of SibFU
- https://elib.sfu-kras.ru/handle/2311/1662
Journal of Siberian Federal University. Chemistry / Methods of Modern Transmission Electron Microscopy in Material Study
Full text (.pdf)