Journal of Siberian Federal University. Mathematics & Physics / Two-layer Model of Reflective Ferromagnetic Films in Terms of Magneto-optical Ellipsometry Studies

Full text (.pdf)
Issue
Journal of Siberian Federal University. Mathematics & Physics. 2017 10 (2)
Authors
Maximova, Olga A.; Ovchinnikov, Sergey G.; Kosyrev, Nikolay N.; Lyaschenko, Sergey A.
Contact information
Maximova, Olga A.: Kirensky Institute of Physics Federal Research Center KSC SB RAS Akademgorodok, 50/38, Krasnoyarsk, 660036 Siberian Federal University Svobodny, 79, Krasnoyarsk, 660041 Russia; ; Ovchinnikov, Sergey G.: Kirensky Institute of Physics Federal Research Center KSC SB RAS Akademgorodok, 50/38, Krasnoyarsk, 660036 Siberian Federal University Svobodny, 79, Krasnoyarsk, 660041 Russia; ; Kosyrev, Nikolay N.: Kirensky Institute of Physics Federal Research Center KSC SB RAS Akademgorodok, 50/38, Krasnoyarsk, 660036 Russia; ; Lyaschenko, Sergey A.: Kirensky Institute of Physics Federal Research Center KSC SB RAS Akademgorodok, 50/38, Krasnoyarsk, 660036 Reshetnev Siberian State Aerospace University Krasnoyarsky Rabochy, 31, Krasnoyarsk, 660037 Russia;
Keywords
Magneto-optical ellipsometry; Kerr effect; two-layer model; ferromagnetic metal; reflection; growth control
Abstract

An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model of ferromagnetic reflective films is in focus. The obtained algorithm can be used to control optical and magneto-optical properties during films growth inside vacuum chambers

Pages
223–232
Paper at repository of SibFU
https://elib.sfu-kras.ru/handle/2311/31548